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Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/922

Title: Investigation of the Effect of Microstructure and Grain Boundaries in Nanostructured CMR Thin Films Using Scanning Tunneling Microscopy (STM) and Local Conductance Map (LCMAP)
Authors: Kar, Sohini
Sarkar, Jayanta
Raychaudhuri, A K
Keywords: Colossal magnetoresistance
grain boundaries
nanostructured films
scanning tunneling microscopy
Issue Date: 2006
Publisher: IEEE Transactions On Nanotechnology
Citation: Sohini Kar, Jayanta Sarkar, and A. K. Raychaudhuri, Investigation of the Effect of Microstructure and Grain Boundaries in Nanostructured CMR Thin Films Using Scanning Tunneling Microscopy (STM) and Local Conductance Map (LCMAP), IEEE Transactions On Nanotechnology, 5, No. 6 (2006).
URI: http://hdl.handle.net/123456789/922
Appears in Collections:2006

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