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Please use this identifier to cite or link to this item:
http://hdl.handle.net/123456789/2421
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| Title: | Superior optical (λ ∼ 1550 nm) emission and detection characteristics of Ge microdisks grown on virtual Si0.5Ge0.5/Si substrates using molecular beam epitaxy |
| Authors: | Singh, Sudarshan
Katiyar, Ajit K
Sarkar, Arijit
Shihabudeen, P K
Chaudhuri, Ayan Roy
Goswami, Dipak K
Ray, Samit K |
| Keywords: | molecular beam epitaxy
virtual SiGe substrate
SK growth mode
Ge microdisks
photoluminescence
p–i–n devices
electroluminescence |
| Issue Date: | 2020 |
| Publisher: | Nanotechnology |
| Citation: | S. Singh , A. K Katiyar, A. Sarkar, P. K. Shihabudeen, A. R.Chaudhuri, D. K. Goswami and S. K Ray, Superior optical (λ ∼ 1550 nm) emission and detection characteristics of Ge microdisks grown on virtual Si0.5Ge0.5/Si substrates using molecular beam epitaxy, Nanotechnology, 31, 115206 (2020) |
| URI: | http://hdl.handle.net/123456789/2421 |
| Appears in Collections: | 2020
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