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Please use this identifier to cite or link to this item: http://hdl.handle.net/123456789/121

Title: Instabilities in Focused Ion Beam-patterned Au nanowires
Authors: Naik, J P
Prewett, P D
Das, K
Raychaudhuri, A K
Issue Date: 2011
Publisher: Microelectronic Engineering
Citation: J. P. Naik, P. D. Prewett, K. Das, A. K. Raychaudhuri, Instabilities in Focused Ion Beam-Patterned Au Nanowires, Microelectronic Engineering, 2011, 88, 2840
Abstract: Focused Ion Beam (FIB) technology has become an indispensable enabling tool for micro nano fabrications. One important application is to use FIB for patterning conducting nanowires of metals down to a few tens of nanometre for applications such as interconnects, heaters and temperature nanosensors. A series of experiments on Au nanowires fabricated by FIB on SixNy membrane show that nanowires with width ≤50 nm have structural instabilities. These are liquid like and first show-up as undulations in nanowire width with clearly defined wave lengths. For smaller widths (~ 20 nm) the instabilities grow and the wires eventually break-up into spherical balls. Further experiments show that the nanowires can be made stable to smaller widths by the use of a Cr underlayer to enhance surface wetting. The observed behaviour is due to the Rayleigh-Plateau instability which occurs for systems in which surface energy dominates.
URI: http://hdl.handle.net/123456789/121
Appears in Collections:2011

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